Loading...
Derniers dépôts
Rechercher
Nombre de documents
83
Nombre de notices
294
Mots-clés
Semiconductors
Calcined clay
A Multilayers
Colloidal solution
X-ray diffraction
A-CNx
A3 Physical vapor deposition processes
Annealing
Plasma etching
CNTs’ collapse
AuCu alloy
Ambipolar material
PECVD
Scanning electron microscopy
Carbon Nanotube
CIGSe
Band gap
Nanotubes
Magnetron sputtering
Low-pressure plasma processing
Applications industrielles
B Chemical synthesis
Anatase
Adsorption
Mott insulator
Buffer Couple
Carbon
V2O3
Biofilms microbiens
Plasmas froids
3 nm in size
B3 Solar cells
A1 Characterization
Amyloid precursor
Atomic layer etching
Vanadium Sesquioxide
Films
Optical properties
XPS
Alloying
Selenization
Kirkendall effect
Ablation laser
B2 Semiconducting indium compounds
Mass spectrometry
Alzheimer's disease
Sputtering
A Chalcogenides
A Thin films
Amorphous
Aluminium nitride
Nanocomposite
Etching
NEXAFS
Integrated optics
BOMBARDMENT
CaTiO3Pr^3^+
Titanium dioxide
Transfert d'énergie
Mott insulators
Optical interferometry
Residual stress
Biomembranes
Biomasse
Capacitance
AlN
C Photoelectron spectroscopy
Thin films
Rutile
SF 6
Non-volatile memory
Physical vapor deposition
TiO2
Aryl-diazonium salts
Argon InP chlorine etching inductive coupled plasma ICP modeling plasma sheath simulation
X-ray photoelectron spectroscopy
Biocapteurs
Resistive switching
Structure
Copper
Transmission electron microscopy
Oxides
Bipolar resistive switching BRS
TEM
Chalcogenide
CH4
B1 Inorganic compounds
Optical waveguides
Bixbyite
Functionalization
Atomic force microscopy
Sol-gel
Spectroscopic ellipsometry
B2 Semiconducting alloys
Avalanche breakdown
CHLORINE PLASMAS
AZO thin films
B2 Quaternary
Band alignment
Thin film