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Conference Papers Year : 2022

Analysis of the degradation of amorphous Si mini-modules under a severe sequential UV/DH test

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Engineering Sciences [physics] Physics [physics]

Ali KHOUZAM  : Connect in order to contact the contributor

https://hal.u-pec.fr/hal-04277449

Submitted on : Thursday, November 9, 2023-2:55:41 PM

Last modification on : Friday, November 10, 2023-3:24:01 AM

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hal-04277449 , version 1 (09-11-2023)

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  • HAL Id : hal-04277449 , version 1

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Julia Vincent, Venkata Ramana Posa, Ali Khouzam, Mustapha Elyaakoubi, Anne Labouret, et al.. Analysis of the degradation of amorphous Si mini-modules under a severe sequential UV/DH test. Journées Nationales du PhotoVoltaïque, JNPV 2022, Nov 2022, Dourdan, France. ⟨hal-04277449⟩

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