Conference Papers
Year : 2022
Ali KHOUZAM : Connect in order to contact the contributor
https://hal.u-pec.fr/hal-04277449
Submitted on : Thursday, November 9, 2023-2:55:41 PM
Last modification on : Friday, November 10, 2023-3:24:01 AM
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- HAL Id : hal-04277449 , version 1
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Julia Vincent, Venkata Ramana Posa, Ali Khouzam, Mustapha Elyaakoubi, Anne Labouret, et al.. Analysis of the degradation of amorphous Si mini-modules under a severe sequential UV/DH test. Journées Nationales du PhotoVoltaïque, JNPV 2022, Nov 2022, Dourdan, France. ⟨hal-04277449⟩
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